Compact Modeling and Circuit-Level Simulation of Silicon Nanophotonic Interconnects

Author(s)
R. Wu, Y. Wang, Z. Zhang, C. Zhang, C. L. Schow, J. E. Bowers, K.-T. Cheng
Publication Date
Publication Type
Conference
Journal/Conference Name
Design, Automation and Test in Europe (DATE) conference
Indexing
Lausanne, Switzerland
Publication File
C1004.pdf762.18 KB