Integrated Chip-scale Si3N4 Wavemeter with Narrow Free Spectral Range and High Stability

Author(s)

C. Xiang, M. A. Tran, T. Komlenovic, J. Hulme, M. Davenport, D. Baney, B. Szafraniec, J. E. Bowers

Publication Date

Fri, 06/17/2016 - 12:00

Publication Type

Journal

Journal/Conference Name

Optics Letters

Indexing

41, 3309-3312

Publication File

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